LUP Statistics
Record
- Title
- Leakage current and breakdown of HfO2/InGaAs MOS capacitors
- Type
- Student Paper
- Publ. year
- 2015
- Author/s
- Winqvist, Edvin
- Department/s
- Department of Physics
- In LUP since
- 2015-06-05
Downloads
| Total | This Year | This Month |
| 1168 | 240 | 20 |
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73 (6%) |
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70 (6%) |
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55 (5%) |
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54 (5%) |
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23 (2%) |
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23 (2%) |
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