LUP Statistics
Record
- Title
- Integration of a Digital Built-in Self-Test for On-Chip Memories
- Type
- Student Paper
- Publ. year
- 2017
- Author/s
- Luo, Xiao; Nouripayam, Masoud
- Department/s
- Department of Electrical and Information Technology
- In LUP since
- 2017-12-12
Downloads
Total | This Year | This Month |
105 | 6 | 2 |
China | 30 (29%) |
Sweden | 24 (23%) |
Germany | 18 (17%) |
United States of America | 10 (10%) |
India | 5 (5%) |
France | 2 (2%) |
Poland | 2 (2%) |
Iran | 2 (2%) |
Taiwan (China) | 2 (2%) |
Finland | 2 (2%) |
Denmark | 1 (1%) |
Bosnia and Herzegovina | 1 (1%) |
Bulgaria | 1 (1%) |
Hong Kong (China) | 1 (1%) |
Netherlands | 1 (1%) |
Ukraine | 1 (1%) |
Singapore | 1 (1%) |
Pakistan | 1 (1%) |