LUP Statistics
Record
- Title
- Damage Analysis of Reactive Ion and Atomic Layer Etched Silicon
- Type
- Student Paper
- Publ. year
- 2023
- Author/s
- Al Abrash, Mohammad
- Department/s
- Solid State Physics; Department of Physics
- In LUP since
- 2023-06-13
Downloads
| Total | This Year | This Month |
| 671 | 344 | 15 |
United States of America  |
240 (37%) |
South Korea  |
85 (13%) |
Germany  |
58 (9%) |
Sweden  |
52 (8%) |
China  |
22 (3%) |
Japan  |
21 (3%) |
Taiwan (China)  |
16 (2%) |
Singapore  |
15 (2%) |
Netherlands (Kingdom of the)  |
13 (2%) |
Russian Federation  |
13 (2%) |
Hong Kong (China)  |
11 (2%) |
India  |
11 (2%) |
Switzerland  |
11 (2%) |
United Kingdom of Great Britain and Northern Ireland  |
9 (1%) |
France  |
8 (1%) |
Australia  |
7 (1%) |
Unknown  |
6 (1%) |
Italy  |
6 (1%) |
Denmark  |
6 (1%) |
Algeria  |
5 (1%) |
Canada  |
5 (1%) |
Czechia  |
4 (1%) |
Ireland  |
3 (0%) |
Romania  |
2 (0%) |
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2 (0%) |
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2 (0%) |
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2 (0%) |
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2 (0%) |
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2 (0%) |
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1 (0%) |
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1 (0%) |