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Record
Title
Structural analysis of HZO thin film and electrode using X-ray diffraction
Type
Student Paper
Publ. year
2024
Author/s
Winsnes, Elliot
Department/s
Synchrotron Radiation Research; Department of Physics
In LUP since
2024-02-13
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879 345 61
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South Korea 211 (24%)
United States of America 182 (21%)
Taiwan (China) 93 (11%)
China 89 (10%)
Sweden 59 (7%)
Germany 28 (3%)
India 25 (3%)
Hong Kong (China) 21 (2%)
Japan 21 (2%)
Unknown 20 (2%)
United Kingdom of Great Britain and Northern Ireland 15 (2%)
France 15 (2%)
Canada 13 (1%)
Finland 11 (1%)
Switzerland 8 (1%)
Singapore 7 (1%)
Brazil 7 (1%)
Luxembourg 5 (1%)
Russian Federation 5 (1%)
Italy 5 (1%)
Denmark 4 (0%)
Romania 4 (0%)
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Iran 3 (0%)
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Uzbekistan 1 (0%)
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Mexico 1 (0%)
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Indonesia 1 (0%)
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The download statistics shown here have been collected since the launch of LUP in October 2007 and are updated every night. Statistics are available for all records with open access fulltexts. Efforts have been made to exclude downloads by robots and track irregular download activities.

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The information on downloads per country is based on the geolocation of IP addresses and may not be completely accurate. The statistics presented here may also change retroactively when the calculation process is improved to provide more accurate results.

Statistics Last Updated
Thu Jul 31 08:41:05 2025