On Reduction of Capture Power for Modular System-on-Chip Test
Singh, Virendra and Larsson, Erik LU
(2008)
IEEE Workshop on RTL and High Level Testing WRTLT08
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340955
- author
- Singh, Virendra
and Larsson, Erik
LU
- publishing date
- 2008
- type
- Contribution to conference
- publication status
- published
- subject
- keywords
- modular system-on-chip, testing, power reduction
- conference name
- IEEE Workshop on RTL and High Level Testing WRTLT08
- conference dates
- 0001-01-02
- language
- English
- LU publication?
- no
- id
- 1533e5de-fd00-4401-94fa-36317edc605c (old id 2340955)
- date added to LUP
- 2016-04-04 13:21:20
- date last changed
- 2018-11-21 21:13:26
@misc{1533e5de-fd00-4401-94fa-36317edc605c,
author = {{Singh, Virendra and Larsson, Erik}},
keywords = {{modular system-on-chip; testing; power reduction}},
language = {{eng}},
title = {{On Reduction of Capture Power for Modular System-on-Chip Test}},
year = {{2008}},
}