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Model-free classification of X-ray scattering signals applied to image segmentation

Lutz-Bueno, V ; Arboleda, C ; Leu, L ; Blunt, MJ ; Busch, A ; Georgiadis, A ; Bertier, P ; Schmatz, J ; Varga, Z and Villanueva-Perez, P LU orcid (2018) In Journal of Applied Crystallography 51(5).
Please use this url to cite or link to this publication:
author
; ; ; ; ; ; ; ; and
publishing date
type
Contribution to journal
publication status
published
in
Journal of Applied Crystallography
volume
51
issue
5
publisher
International Union of Crystallography
external identifiers
  • scopus:85054054180
ISSN
1600-5767
DOI
10.1107/S1600576718011032
language
English
LU publication?
no
id
274626c1-ab50-4884-9429-645014235b32
date added to LUP
2019-03-29 17:10:39
date last changed
2023-11-18 17:31:24
@article{274626c1-ab50-4884-9429-645014235b32,
  author       = {{Lutz-Bueno, V and Arboleda, C and Leu, L and Blunt, MJ and Busch, A and Georgiadis, A and Bertier, P and Schmatz, J and Varga, Z and Villanueva-Perez, P}},
  issn         = {{1600-5767}},
  language     = {{eng}},
  number       = {{5}},
  publisher    = {{International Union of Crystallography}},
  series       = {{Journal of Applied Crystallography}},
  title        = {{Model-free classification of X-ray scattering signals applied to image segmentation}},
  url          = {{http://dx.doi.org/10.1107/S1600576718011032}},
  doi          = {{10.1107/S1600576718011032}},
  volume       = {{51}},
  year         = {{2018}},
}