Recording of optical near-field in laser photoelectron microscope by means of two-photon ionization by femtosecond laser pulses
(2004) 5402. p.17-24- Abstract
- It is shown that the high-resolution laser photoelectron microscope withsubwavelength-spatial resolution can be used for an absolute values ofthe two-photon external photoelectric effect measurements with high (afew nm-scale) localization. The spatial distribution of light intensityin the near field is studied by observing the photoelectron projectionimages of a subwavelength nanoaperture. The imaging electrons areobtained as a result of two-photon external photoelectric effect inducedin the aperture formed at the end of an optical fiber by femtosecondpulses of the second-harmonic radiation (410 nm) of a Ti:sapphire laser.The light-field distribution in the aperture is not distorted by anynear-by object, which allows the first... (More)
- It is shown that the high-resolution laser photoelectron microscope withsubwavelength-spatial resolution can be used for an absolute values ofthe two-photon external photoelectric effect measurements with high (afew nm-scale) localization. The spatial distribution of light intensityin the near field is studied by observing the photoelectron projectionimages of a subwavelength nanoaperture. The imaging electrons areobtained as a result of two-photon external photoelectric effect inducedin the aperture formed at the end of an optical fiber by femtosecondpulses of the second-harmonic radiation (410 nm) of a Ti:sapphire laser.The light-field distribution in the aperture is not distorted by anynear-by object, which allows the first nonperturbing measurement of sucha distribution. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/527793
- author
- Chekalin, Sergey V. ; Kompanets, V. O. ; Letokhov, Vladilen LU ; Matveets, Yu A. ; Mironov, B. N. and Sekatskii, S. K.
- publishing date
- 2004
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- International Workshop on Quantum Optics 2003. Edited by Samartsev, Vitaly V. Proceedings of the SPIE, Volume 5402, pp. 17-24 (2004).
- volume
- 5402
- pages
- 17 - 24
- publisher
- SPIE
- external identifiers
-
- scopus:3042590905
- DOI
- 10.1117/12.558810
- language
- English
- LU publication?
- no
- id
- 6c555637-9475-4ce0-8c6c-bfe89fa16485 (old id 527793)
- date added to LUP
- 2016-04-04 11:19:39
- date last changed
- 2022-01-29 21:41:47
@inproceedings{6c555637-9475-4ce0-8c6c-bfe89fa16485,
abstract = {{It is shown that the high-resolution laser photoelectron microscope withsubwavelength-spatial resolution can be used for an absolute values ofthe two-photon external photoelectric effect measurements with high (afew nm-scale) localization. The spatial distribution of light intensityin the near field is studied by observing the photoelectron projectionimages of a subwavelength nanoaperture. The imaging electrons areobtained as a result of two-photon external photoelectric effect inducedin the aperture formed at the end of an optical fiber by femtosecondpulses of the second-harmonic radiation (410 nm) of a Ti:sapphire laser.The light-field distribution in the aperture is not distorted by anynear-by object, which allows the first nonperturbing measurement of sucha distribution.}},
author = {{Chekalin, Sergey V. and Kompanets, V. O. and Letokhov, Vladilen and Matveets, Yu A. and Mironov, B. N. and Sekatskii, S. K.}},
booktitle = {{International Workshop on Quantum Optics 2003. Edited by Samartsev, Vitaly V. Proceedings of the SPIE, Volume 5402, pp. 17-24 (2004).}},
language = {{eng}},
pages = {{17--24}},
publisher = {{SPIE}},
title = {{Recording of optical near-field in laser photoelectron microscope by means of two-photon ionization by femtosecond laser pulses}},
url = {{http://dx.doi.org/10.1117/12.558810}},
doi = {{10.1117/12.558810}},
volume = {{5402}},
year = {{2004}},
}