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Scanning tunneling microscope and luminescence nanocharacterization of semiconductor quantum dots

Johansson, Mikael LU ; Håkanson, Ulf LU ; Pistol, Mats-Erik LU and Samuelson, Lars LU (2004) Sanken Intl Symp on Scientific and Industrial Nanotechnology, Osaka, Japan (2004), invited
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author
; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Book of extended abstracts: Sanken Intl Symp on Scientific and Industrial Nanotechnology, Osaka, Japan (2004), invited
conference name
Sanken Intl Symp on Scientific and Industrial Nanotechnology, Osaka, Japan (2004), invited
conference dates
0001-01-02
language
English
LU publication?
yes
id
0e9361c1-9a1f-46d3-b792-50ad6f3f2736 (old id 962462)
date added to LUP
2016-04-04 14:03:57
date last changed
2018-11-21 21:18:04
@inproceedings{0e9361c1-9a1f-46d3-b792-50ad6f3f2736,
  author       = {{Johansson, Mikael and Håkanson, Ulf and Pistol, Mats-Erik and Samuelson, Lars}},
  booktitle    = {{Book of extended abstracts: Sanken Intl Symp on Scientific and Industrial Nanotechnology, Osaka, Japan (2004), invited}},
  language     = {{eng}},
  title        = {{Scanning tunneling microscope and luminescence nanocharacterization of semiconductor quantum dots}},
  year         = {{2004}},
}