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On the Application of Elastic Scattering Analysis as a Complement to PIXE for the Determination of Light Elements in Thin Aerosol Samples

Bohgard, Mats LU ; Johansson, Eva-Marta and Martinsson, Bengt LU (1983) LUTFD2/TFKF-3041)/1-121983).
Abstract
The potential of elemental analysis of light elements by measuring elastically scattered particles as a complement to PIXE (Particle Induced X-ray Emission analysis), when using a 3 MV electrostatic tandem accelerator is discussed. The discussion is based on protons and He ions with energies suitable for PIXE. Some experimental results of scattering yields are included.
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author
organization
publishing date
type
Book/Report
publication status
published
subject
volume
LUTFD2/TFKF-3041)/1-121983)
pages
12 pages
publisher
[Publisher information missing]
language
English
LU publication?
yes
id
753bd1d8-9967-4ce1-80b7-207a5b52a7fe (old id 2298194)
date added to LUP
2012-01-22 22:33:07
date last changed
2016-04-16 10:44:13
@misc{753bd1d8-9967-4ce1-80b7-207a5b52a7fe,
  abstract     = {The potential of elemental analysis of light elements by measuring elastically scattered particles as a complement to PIXE (Particle Induced X-ray Emission analysis), when using a 3 MV electrostatic tandem accelerator is discussed. The discussion is based on protons and He ions with energies suitable for PIXE. Some experimental results of scattering yields are included.},
  author       = {Bohgard, Mats and Johansson, Eva-Marta and Martinsson, Bengt},
  language     = {eng},
  pages        = {12},
  publisher    = {ARRAY(0xb1e6310)},
  title        = {On the Application of Elastic Scattering Analysis as a Complement to PIXE for the Determination of Light Elements in Thin Aerosol Samples},
  volume       = {LUTFD2/TFKF-3041)/1-121983)},
  year         = {1983},
}