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Checking Pipelined Distributed Global Properties for Post-silicon Debug

Larsson, Erik LU ; Vermeulen, Bart and Goossens, Kees (2010) IEEE Eleventh Workshop on RTL and High Level Testing, 2010
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IEEE Eleventh Workshop on RTL and High Level Testing, 2010
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English
LU publication?
no
id
2cc46287-9e29-4e8e-8be8-dea987504069 (old id 2340869)
date added to LUP
2012-02-10 13:51:20
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2016-06-29 09:09:58
@misc{2cc46287-9e29-4e8e-8be8-dea987504069,
  author       = {Larsson, Erik and Vermeulen, Bart and Goossens, Kees},
  language     = {eng},
  title        = {Checking Pipelined Distributed Global Properties for Post-silicon Debug},
  year         = {2010},
}