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Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules

Vinay, N.S. ; Rawat, Indira ; Gaur, M.S. ; Larsson, Erik LU orcid and Singh, Virendra (2010) IEEE East-West Design and Test Symposium (EWDTS10)
Please use this url to cite or link to this publication:
author
; ; ; and
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Design & Test Symposium (EWDTS), 2010 East-West
conference name
IEEE East-West Design and Test Symposium (EWDTS10)
conference location
St. Petersburg, Russian Federation
conference dates
2010-09-17 - 2010-09-20
external identifiers
  • scopus:79955954690
ISBN
978-1-4244-9555-9
DOI
10.1109/EWDTS.2010.5742053
language
English
LU publication?
no
id
4d055bb4-89c5-4133-80b8-b5b30377249b (old id 2340884)
date added to LUP
2016-04-04 14:24:14
date last changed
2022-01-30 02:39:00
@inproceedings{4d055bb4-89c5-4133-80b8-b5b30377249b,
  author       = {{Vinay, N.S. and Rawat, Indira and Gaur, M.S. and Larsson, Erik and Singh, Virendra}},
  booktitle    = {{Design & Test Symposium (EWDTS), 2010 East-West}},
  isbn         = {{978-1-4244-9555-9}},
  language     = {{eng}},
  title        = {{Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules}},
  url          = {{http://dx.doi.org/10.1109/EWDTS.2010.5742053}},
  doi          = {{10.1109/EWDTS.2010.5742053}},
  year         = {{2010}},
}