Fault-tolerant average execution time optimization for general-purpose multi-processor system-on-chips
Vayrynen, M. ; Singh, V. and Larsson, Erik LU
(2009)
Design Automation and Test in Europe (DATE 2009)
p.484-489
- Abstract
- Fault-tolerance is due to the semiconductor technology development important, not only for safety-critical systems but also for general-purpose (non-safety critical) systems. However, instead of guaranteeing that deadlines always are met, it is for general-purpose systems important to minimize the average execution time (AET) while ensuring fault-tolerance. For a given job and a soft (transient) error probability, we define mathematical formulas for AET that includes bus communication overhead for both voting (active replication) and rollback-recovery with checkpointing (RRC). And, for a given multi-processor system-on-chip (MPSoC), we define integer linear programming (ILP) models that minimize AET including bus communication overhead... (More)
- Fault-tolerance is due to the semiconductor technology development important, not only for safety-critical systems but also for general-purpose (non-safety critical) systems. However, instead of guaranteeing that deadlines always are met, it is for general-purpose systems important to minimize the average execution time (AET) while ensuring fault-tolerance. For a given job and a soft (transient) error probability, we define mathematical formulas for AET that includes bus communication overhead for both voting (active replication) and rollback-recovery with checkpointing (RRC). And, for a given multi-processor system-on-chip (MPSoC), we define integer linear programming (ILP) models that minimize AET including bus communication overhead when: (1) selecting the number of checkpoints when using RRC, (2) finding the number of processors and job-to-processor assignment when using voting, and (3) defining fault-tolerance scheme (voting or RRC) per job and defining its usage for each job. Experiments demonstrate significant savings in AET. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340936
- author
- Vayrynen, M.
; Singh, V.
and Larsson, Erik
LU
- publishing date
- 2009
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- 2009 Design, Automation & Test in Europe Conference & Exhibition
- pages
- 484 - 489
- conference name
- Design Automation and Test in Europe (DATE 2009)
- conference location
- Nice, France
- conference dates
- 2009-04-20 - 2009-04-24
- external identifiers
-
- scopus:70350068433
- ISBN
- 978-1-4244-3781-8
- DOI
- 10.1109/DATE.2009.5090713
- language
- English
- LU publication?
- no
- id
- c5bd3bcc-246e-48f9-a31e-8b8c5a4bfdaa (old id 2340936)
- date added to LUP
- 2016-04-04 13:32:38
- date last changed
- 2022-01-30 02:39:00
@inproceedings{c5bd3bcc-246e-48f9-a31e-8b8c5a4bfdaa,
abstract = {{Fault-tolerance is due to the semiconductor technology development important, not only for safety-critical systems but also for general-purpose (non-safety critical) systems. However, instead of guaranteeing that deadlines always are met, it is for general-purpose systems important to minimize the average execution time (AET) while ensuring fault-tolerance. For a given job and a soft (transient) error probability, we define mathematical formulas for AET that includes bus communication overhead for both voting (active replication) and rollback-recovery with checkpointing (RRC). And, for a given multi-processor system-on-chip (MPSoC), we define integer linear programming (ILP) models that minimize AET including bus communication overhead when: (1) selecting the number of checkpoints when using RRC, (2) finding the number of processors and job-to-processor assignment when using voting, and (3) defining fault-tolerance scheme (voting or RRC) per job and defining its usage for each job. Experiments demonstrate significant savings in AET.}},
author = {{Vayrynen, M. and Singh, V. and Larsson, Erik}},
booktitle = {{2009 Design, Automation & Test in Europe Conference & Exhibition}},
isbn = {{978-1-4244-3781-8}},
language = {{eng}},
pages = {{484--489}},
title = {{Fault-tolerant average execution time optimization for general-purpose multi-processor system-on-chips}},
url = {{http://dx.doi.org/10.1109/DATE.2009.5090713}},
doi = {{10.1109/DATE.2009.5090713}},
year = {{2009}},
}