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SOC Test Scheduling with Test Set Sharing and Broadcasting

Larsson, Anders; Larsson, Erik LU ; Eles, Petru Ion and Peng, Zebo (2005) IEEE Asian Test Symposium In [Host publication title missing] p.162-162
Abstract
Due to the increasing test data volume needed to test core-based System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In contrast to approaches where a fixed test set for each core is assumed, we explore the possibility to use overlapping test patterns from the tests in the system. The overlapping tests serves as alternatives to the original dedicated test for the cores and, if selected, they are transported to the cores in a broadcasted manner so that several cores are tested concurrently. We have made use of a Constraint Logic Programming technique to select suitable tests for each core in the system and schedule the selected tests such that the test application time is minimized... (More)
Due to the increasing test data volume needed to test core-based System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In contrast to approaches where a fixed test set for each core is assumed, we explore the possibility to use overlapping test patterns from the tests in the system. The overlapping tests serves as alternatives to the original dedicated test for the cores and, if selected, they are transported to the cores in a broadcasted manner so that several cores are tested concurrently. We have made use of a Constraint Logic Programming technique to select suitable tests for each core in the system and schedule the selected tests such that the test application time is minimized while designer-specified hardware constraints are satisfied. The experimental results indicate that we can on average reduce the test application time with 23%. (Less)
Please use this url to cite or link to this publication:
author
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
testing, system-on-chip, test scheduling, overlapping test patterns, constraint logic programming
in
[Host publication title missing]
pages
162 - 162
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
IEEE Asian Test Symposium
external identifiers
  • Scopus:33846929949
DOI
10.1109/ATS.2005.100
language
English
LU publication?
no
id
9bee3c19-af5d-4dce-948a-e976947bfe68 (old id 2341044)
date added to LUP
2012-02-10 13:39:09
date last changed
2016-10-13 04:48:36
@misc{9bee3c19-af5d-4dce-948a-e976947bfe68,
  abstract     = {Due to the increasing test data volume needed to test core-based System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In contrast to approaches where a fixed test set for each core is assumed, we explore the possibility to use overlapping test patterns from the tests in the system. The overlapping tests serves as alternatives to the original dedicated test for the cores and, if selected, they are transported to the cores in a broadcasted manner so that several cores are tested concurrently. We have made use of a Constraint Logic Programming technique to select suitable tests for each core in the system and schedule the selected tests such that the test application time is minimized while designer-specified hardware constraints are satisfied. The experimental results indicate that we can on average reduce the test application time with 23%.},
  author       = {Larsson, Anders and Larsson, Erik and Eles, Petru Ion and Peng, Zebo},
  keyword      = {testing,system-on-chip,test scheduling,overlapping test patterns,constraint logic programming},
  language     = {eng},
  pages        = {162--162},
  publisher    = {ARRAY(0xce2de60)},
  series       = {[Host publication title missing]},
  title        = {SOC Test Scheduling with Test Set Sharing and Broadcasting},
  url          = {http://dx.doi.org/10.1109/ATS.2005.100},
  year         = {2005},
}