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Test Scheduling for Modular SOCs in an Abort-on-Fail Environment

Ingelsson, Urban; Goel, Sandeep Kumar; Larsson, Erik LU and Marinissen, Erik Jan (2005) IEEE European Test Symposium ETS 05, 2005 In [Host publication title missing] p.8-13
Abstract
Complex SOCs areincreasingly tested in a modular fashion, which enables us torecord the yield-per-module. In this paper, we consider theyield-per-module as the pass probability of the module smanufacturing test. We use it to exploit the abort-on-fail featureof ATEs, in order to reduce the expected test application time. Wepresent a model for expected test application time, which obtainsincreasing accuracy due to decreasing granularity of the abortabletest unit. For a given SOC, with a modular test architectureconsisting of wrappers and disjunct TAMs, and for given passprobabilities per module test, we schedule the tests on each TAMsuch that the expected test application time is minimized. Wedescribe two heuristic scheduling approaches, one... (More)
Complex SOCs areincreasingly tested in a modular fashion, which enables us torecord the yield-per-module. In this paper, we consider theyield-per-module as the pass probability of the module smanufacturing test. We use it to exploit the abort-on-fail featureof ATEs, in order to reduce the expected test application time. Wepresent a model for expected test application time, which obtainsincreasing accuracy due to decreasing granularity of the abortabletest unit. For a given SOC, with a modular test architectureconsisting of wrappers and disjunct TAMs, and for given passprobabilities per module test, we schedule the tests on each TAMsuch that the expected test application time is minimized. Wedescribe two heuristic scheduling approaches, one without and onewith preemption. Experimental results for the ITC 02 SOC TestBenchmarks demonstrate the effectiveness of our approach, as weachieve up to 97% reduction in the expected test application time,without any modification to the SOC or ATE. (Less)
Please use this url to cite or link to this publication:
author
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
testing, systems-on-chip, yield-per-module, TAM, test scheduling
in
[Host publication title missing]
pages
8 - 13
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
IEEE European Test Symposium ETS 05, 2005
external identifiers
  • Scopus:33744485048
ISBN
0-7695-2341-2
DOI
10.1109/ETS.2005.38
language
English
LU publication?
no
id
07243a4c-b351-423c-bd8f-1bd5bba27779 (old id 2341081)
date added to LUP
2012-02-10 13:36:44
date last changed
2016-10-13 04:43:38
@misc{07243a4c-b351-423c-bd8f-1bd5bba27779,
  abstract     = {Complex SOCs areincreasingly tested in a modular fashion, which enables us torecord the yield-per-module. In this paper, we consider theyield-per-module as the pass probability of the module smanufacturing test. We use it to exploit the abort-on-fail featureof ATEs, in order to reduce the expected test application time. Wepresent a model for expected test application time, which obtainsincreasing accuracy due to decreasing granularity of the abortabletest unit. For a given SOC, with a modular test architectureconsisting of wrappers and disjunct TAMs, and for given passprobabilities per module test, we schedule the tests on each TAMsuch that the expected test application time is minimized. Wedescribe two heuristic scheduling approaches, one without and onewith preemption. Experimental results for the ITC 02 SOC TestBenchmarks demonstrate the effectiveness of our approach, as weachieve up to 97% reduction in the expected test application time,without any modification to the SOC or ATE.},
  author       = {Ingelsson, Urban and Goel, Sandeep Kumar and Larsson, Erik and Marinissen, Erik Jan},
  isbn         = {0-7695-2341-2},
  keyword      = {testing,systems-on-chip,yield-per-module,TAM,test scheduling},
  language     = {eng},
  pages        = {8--13},
  publisher    = {ARRAY(0x85fb3f8)},
  series       = {[Host publication title missing]},
  title        = {Test Scheduling for Modular SOCs in an Abort-on-Fail Environment},
  url          = {http://dx.doi.org/10.1109/ETS.2005.38},
  year         = {2005},
}