Characterization of some technically important defects in semiconductors
(1982)- Abstract
- [abstract missing]
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2439510
- author
- Meijer, Erik
- supervisor
- opponent
-
- unknown], [unknown
- publishing date
- 1982
- type
- Thesis
- publication status
- published
- subject
- keywords
- Fysicumarkivet A:1982:Meijer
- defense location
- Fysiska Institutionens föreläsningssal
- defense date
- 1982-11-29 10:15:00
- language
- English
- LU publication?
- no
- id
- 816d9c25-7879-4bae-995c-29fec1e72560 (old id 2439510)
- date added to LUP
- 2016-04-04 13:13:51
- date last changed
- 2018-11-21 21:12:47
@phdthesis{816d9c25-7879-4bae-995c-29fec1e72560,
abstract = {{[abstract missing]}},
author = {{Meijer, Erik}},
keywords = {{Fysicumarkivet A:1982:Meijer}},
language = {{eng}},
title = {{Characterization of some technically important defects in semiconductors}},
year = {{1982}},
}