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Fault management in an IEEE P1687 (IJTAG) environment

Larsson, Erik LU and Shibin, Konstatin (2012) 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems In [Host publication title missing] p.7-7
Abstract
To meet the constant demand for performance, it is increasingly common with multi-processor system- on-chips (MPSoCs). As these integrated circuits (ICs) may contain billions of transistors squeezed on a few square centimeters, it is difficult to ensure that they are correct. Defects may escape manufacturing test or develop during operation and, further, ICs manufactured in later semiconductor technologies are increasingly sensitive to environmental disturbances. These defects may be permanent (hard) or transient (soft).

To enable graceful degradation, fault management can be applied to handle eventual defects. Fault management include collection of error statuses from each of the processors, classify the defects, fault mark... (More)
To meet the constant demand for performance, it is increasingly common with multi-processor system- on-chips (MPSoCs). As these integrated circuits (ICs) may contain billions of transistors squeezed on a few square centimeters, it is difficult to ensure that they are correct. Defects may escape manufacturing test or develop during operation and, further, ICs manufactured in later semiconductor technologies are increasingly sensitive to environmental disturbances. These defects may be permanent (hard) or transient (soft).

To enable graceful degradation, fault management can be applied to handle eventual defects. Fault management include collection of error statuses from each of the processors, classify the defects, fault mark defective processors, schedule jobs on non-defective processors.

This tutorial consists of three parts. First, we will discuss the need of IEEE P1687 (IJTAG), a standardized mechanism to access embedded features. Second, we will discuss how to make use of IEEE P1697 for fault management. And, third, we will make a demonstration of a fault management solution that makes use of IEEE P1687. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
IEEE 1687, Reliability, Fault management, Aging
in
[Host publication title missing]
pages
1 pages
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
external identifiers
  • WOS:000312905700007
ISBN
978-1-4244-9754-6
language
English
LU publication?
yes
id
612e517b-48c0-466c-aa16-8cb1d8e4270f (old id 2518132)
date added to LUP
2012-06-08 14:55:48
date last changed
2016-04-16 07:55:52
@misc{612e517b-48c0-466c-aa16-8cb1d8e4270f,
  abstract     = {To meet the constant demand for performance, it is increasingly common with multi-processor system- on-chips (MPSoCs). As these integrated circuits (ICs) may contain billions of transistors squeezed on a few square centimeters, it is difficult to ensure that they are correct. Defects may escape manufacturing test or develop during operation and, further, ICs manufactured in later semiconductor technologies are increasingly sensitive to environmental disturbances. These defects may be permanent (hard) or transient (soft).<br/><br>
To enable graceful degradation, fault management can be applied to handle eventual defects. Fault management include collection of error statuses from each of the processors, classify the defects, fault mark defective processors, schedule jobs on non-defective processors.<br/><br>
This tutorial consists of three parts. First, we will discuss the need of IEEE P1687 (IJTAG), a standardized mechanism to access embedded features. Second, we will discuss how to make use of IEEE P1697 for fault management. And, third, we will make a demonstration of a fault management solution that makes use of IEEE P1687.},
  author       = {Larsson, Erik and Shibin, Konstatin},
  isbn         = {978-1-4244-9754-6},
  keyword      = {IEEE 1687,Reliability,Fault management,Aging},
  language     = {eng},
  pages        = {7--7},
  publisher    = {ARRAY(0x9b321d8)},
  series       = {[Host publication title missing]},
  title        = {Fault management in an IEEE P1687 (IJTAG) environment},
  year         = {2012},
}