Fault management in an IEEE P1687 (IJTAG) environment
Larsson, Erik LU
and Shibin, Konstatin
(2012)
2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
p.7-7
- Abstract
- To meet the constant demand for performance, it is increasingly common with multi-processor system- on-chips (MPSoCs). As these integrated circuits (ICs) may contain billions of transistors squeezed on a few square centimeters, it is difficult to ensure that they are correct. Defects may escape manufacturing test or develop during operation and, further, ICs manufactured in later semiconductor technologies are increasingly sensitive to environmental disturbances. These defects may be permanent (hard) or transient (soft).
To enable graceful degradation, fault management can be applied to handle eventual defects. Fault management include collection of error statuses from each of the processors, classify the defects, fault mark... (More) - To meet the constant demand for performance, it is increasingly common with multi-processor system- on-chips (MPSoCs). As these integrated circuits (ICs) may contain billions of transistors squeezed on a few square centimeters, it is difficult to ensure that they are correct. Defects may escape manufacturing test or develop during operation and, further, ICs manufactured in later semiconductor technologies are increasingly sensitive to environmental disturbances. These defects may be permanent (hard) or transient (soft).
To enable graceful degradation, fault management can be applied to handle eventual defects. Fault management include collection of error statuses from each of the processors, classify the defects, fault mark defective processors, schedule jobs on non-defective processors.
This tutorial consists of three parts. First, we will discuss the need of IEEE P1687 (IJTAG), a standardized mechanism to access embedded features. Second, we will discuss how to make use of IEEE P1697 for fault management. And, third, we will make a demonstration of a fault management solution that makes use of IEEE P1687. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2518132
- author
- Larsson, Erik
LU
and Shibin, Konstatin
- organization
- publishing date
- 2012
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- IEEE 1687, Reliability, Fault management, Aging
- host publication
- [Host publication title missing]
- pages
- 1 pages
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
- conference location
- Tallinn, Estonia
- conference dates
- 2012-04-18
- external identifiers
-
- wos:000312905700007
- ISBN
- 978-1-4244-9754-6
- language
- English
- LU publication?
- yes
- id
- 612e517b-48c0-466c-aa16-8cb1d8e4270f (old id 2518132)
- date added to LUP
- 2016-04-04 10:27:56
- date last changed
- 2018-11-21 20:58:54
@inproceedings{612e517b-48c0-466c-aa16-8cb1d8e4270f,
abstract = {{To meet the constant demand for performance, it is increasingly common with multi-processor system- on-chips (MPSoCs). As these integrated circuits (ICs) may contain billions of transistors squeezed on a few square centimeters, it is difficult to ensure that they are correct. Defects may escape manufacturing test or develop during operation and, further, ICs manufactured in later semiconductor technologies are increasingly sensitive to environmental disturbances. These defects may be permanent (hard) or transient (soft).<br/><br>
To enable graceful degradation, fault management can be applied to handle eventual defects. Fault management include collection of error statuses from each of the processors, classify the defects, fault mark defective processors, schedule jobs on non-defective processors.<br/><br>
This tutorial consists of three parts. First, we will discuss the need of IEEE P1687 (IJTAG), a standardized mechanism to access embedded features. Second, we will discuss how to make use of IEEE P1697 for fault management. And, third, we will make a demonstration of a fault management solution that makes use of IEEE P1687.}},
author = {{Larsson, Erik and Shibin, Konstatin}},
booktitle = {{[Host publication title missing]}},
isbn = {{978-1-4244-9754-6}},
keywords = {{IEEE 1687; Reliability; Fault management; Aging}},
language = {{eng}},
pages = {{7--7}},
publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
title = {{Fault management in an IEEE P1687 (IJTAG) environment}},
url = {{https://lup.lub.lu.se/search/files/5545411/2518133.pdf}},
year = {{2012}},
}