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A single probe for imaging photons, electrons and physical forces

Pilet, Nicolas; Lisunova, Yuliya; Lamattina, Fabio; Stevenson, Stephanie E.; Pigozzi, Giancarlo; Paruch, Patrycja; Fink, Rainer H.; Hug, Hans J.; Quitmann, Christoph LU and Raabe, Joerg (2016) In Nanotechnology 27(23).
Abstract

The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements. Just by the variation of one parameter, the SFM probe can be utilised to detect either sample photo-emitted electrons or transmitted photons. This allows the use of a single probe to detect electrons, photons and physical forces of interest.... (More)

The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements. Just by the variation of one parameter, the SFM probe can be utilised to detect either sample photo-emitted electrons or transmitted photons. This allows the use of a single probe to detect electrons, photons and physical forces of interest. We also show recent progress and demonstrate the current limitations of using a high aspect ratio coaxial SFM probe to detect photo-emitted electrons with very high lateral resolution. Novel probe designs are proposed to further progress in using an SFM probe as a STXM detector.

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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
carbon nanotube, co-axial tip, electron, photon detection, scanning force microscopy, scanning probe, x-ray microscopy
in
Nanotechnology
volume
27
issue
23
publisher
IOP Publishing
external identifiers
  • Scopus:84969520085
ISSN
0957-4484
DOI
10.1088/0957-4484/27/23/235705
language
English
LU publication?
yes
id
3dff0f80-100b-47ae-b910-0ca0f3f0926c
date added to LUP
2016-09-28 12:48:34
date last changed
2016-11-03 11:19:58
@misc{3dff0f80-100b-47ae-b910-0ca0f3f0926c,
  abstract     = {<p>The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements. Just by the variation of one parameter, the SFM probe can be utilised to detect either sample photo-emitted electrons or transmitted photons. This allows the use of a single probe to detect electrons, photons and physical forces of interest. We also show recent progress and demonstrate the current limitations of using a high aspect ratio coaxial SFM probe to detect photo-emitted electrons with very high lateral resolution. Novel probe designs are proposed to further progress in using an SFM probe as a STXM detector.</p>},
  author       = {Pilet, Nicolas and Lisunova, Yuliya and Lamattina, Fabio and Stevenson, Stephanie E. and Pigozzi, Giancarlo and Paruch, Patrycja and Fink, Rainer H. and Hug, Hans J. and Quitmann, Christoph and Raabe, Joerg},
  issn         = {0957-4484},
  keyword      = {carbon nanotube,co-axial tip,electron,photon detection,scanning force microscopy,scanning probe,x-ray microscopy},
  language     = {eng},
  month        = {05},
  number       = {23},
  publisher    = {ARRAY(0x7826720)},
  series       = {Nanotechnology},
  title        = {A single probe for imaging photons, electrons and physical forces},
  url          = {http://dx.doi.org/10.1088/0957-4484/27/23/235705},
  volume       = {27},
  year         = {2016},
}