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Sensitivity analysis of the Benchmark Simulation Model no 1

Pons, M.-N.; Jeppsson, Ulf LU ; Flores, Xavier LU ; Benedetti, L.; Lourenco da Silva, M.; Nopens, I.; Alex, J.; Copp, J.B.; Gernaey, K.V. and Rosén, Christian LU , et al. (2008) 18th European symposium on Computer Aided Process Engineering (ESCAPE-18)
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18th European symposium on Computer Aided Process Engineering (ESCAPE-18)
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9a3c3c3d-09b7-48aa-b2c0-87062b9441d3 (old id 4391333)
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@misc{9a3c3c3d-09b7-48aa-b2c0-87062b9441d3,
  author       = {Pons, M.-N. and Jeppsson, Ulf and Flores, Xavier and Benedetti, L. and Lourenco da Silva, M. and Nopens, I. and Alex, J. and Copp, J.B. and Gernaey, K.V. and Rosén, Christian and Steyer, J.-P. and Vanrolleghem, P.A.},
  language     = {eng},
  title        = {Sensitivity analysis of the Benchmark Simulation Model no 1},
  year         = {2008},
}