Advanced

On integrated test of embedded components

Spaanenburg, Lambert LU and Alberts, R (2002) ProGress Workshop In Proceedings 3rd Progress Workshop p.224-229
Abstract
Embedded systems are a characteristic but intangible part of an embedding environment. This poses a severe testing problem that gets further aggravated in embedded networks. The co-presence of hardware and software needs both behavioral and structural aspects to be covered, preferably by a single on-chip paradigm. The paper investigates the potential role of neural networks and introduces a Built-In Functional Test concept to extend the BILBO technology to the behavioral level.
Please use this url to cite or link to this publication:
author
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
Test Pattern Compaction, Built-in Test, FPGA, Design for Test, Time-delay ANN
in
Proceedings 3rd Progress Workshop
pages
224 - 229
publisher
STW
conference name
ProGress Workshop
ISBN
90-73461-34-0
language
English
LU publication?
no
id
8d5a0764-d292-4c9a-a460-4ab1a83baa56 (old id 603894)
date added to LUP
2007-12-03 11:52:31
date last changed
2016-06-29 08:56:08
@misc{8d5a0764-d292-4c9a-a460-4ab1a83baa56,
  abstract     = {Embedded systems are a characteristic but intangible part of an embedding environment. This poses a severe testing problem that gets further aggravated in embedded networks. The co-presence of hardware and software needs both behavioral and structural aspects to be covered, preferably by a single on-chip paradigm. The paper investigates the potential role of neural networks and introduces a Built-In Functional Test concept to extend the BILBO technology to the behavioral level.},
  author       = {Spaanenburg, Lambert and Alberts, R},
  isbn         = {90-73461-34-0},
  keyword      = {Test Pattern Compaction,Built-in Test,FPGA,Design for Test,Time-delay ANN},
  language     = {eng},
  pages        = {224--229},
  publisher    = {ARRAY(0xa23c3b0)},
  series       = {Proceedings 3rd Progress Workshop},
  title        = {On integrated test of embedded components},
  year         = {2002},
}