Skip to main content

Lund University Publications

LUND UNIVERSITY LIBRARIES

On integrated test of embedded components

Spaanenburg, Lambert LU and Alberts, R (2002) ProGress Workshop p.224-229
Abstract
Embedded systems are a characteristic but intangible part of an embedding environment. This poses a severe testing problem that gets further aggravated in embedded networks. The co-presence of hardware and software needs both behavioral and structural aspects to be covered, preferably by a single on-chip paradigm. The paper investigates the potential role of neural networks and introduces a Built-In Functional Test concept to extend the BILBO technology to the behavioral level.
Please use this url to cite or link to this publication:
author
and
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
Test Pattern Compaction, Built-in Test, FPGA, Design for Test, Time-delay ANN
host publication
Proceedings 3rd Progress Workshop
pages
224 - 229
publisher
STW
conference name
ProGress Workshop
conference location
Netherlands
conference dates
0001-01-02
ISBN
90-73461-34-0
language
English
LU publication?
no
id
8d5a0764-d292-4c9a-a460-4ab1a83baa56 (old id 603894)
date added to LUP
2016-04-04 10:30:11
date last changed
2018-11-21 20:59:08
@inproceedings{8d5a0764-d292-4c9a-a460-4ab1a83baa56,
  abstract     = {{Embedded systems are a characteristic but intangible part of an embedding environment. This poses a severe testing problem that gets further aggravated in embedded networks. The co-presence of hardware and software needs both behavioral and structural aspects to be covered, preferably by a single on-chip paradigm. The paper investigates the potential role of neural networks and introduces a Built-In Functional Test concept to extend the BILBO technology to the behavioral level.}},
  author       = {{Spaanenburg, Lambert and Alberts, R}},
  booktitle    = {{Proceedings 3rd Progress Workshop}},
  isbn         = {{90-73461-34-0}},
  keywords     = {{Test Pattern Compaction; Built-in Test; FPGA; Design for Test; Time-delay ANN}},
  language     = {{eng}},
  pages        = {{224--229}},
  publisher    = {{STW}},
  title        = {{On integrated test of embedded components}},
  year         = {{2002}},
}