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Statistical analysis of the UWB channel in an industrial environment

Kåredal, Johan LU ; Wyne, Shurjeel LU ; Almers, Peter LU ; Tufvesson, Fredrik LU orcid and Molisch, Andreas LU (2004) IEEE Vehicular Technology Conference (VTC2004-fall) p.81-85
Abstract
In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger... (More)
In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger distances, several hundred multipath components need to be collected to capture 50% of the available energy (Less)
Please use this url to cite or link to this publication:
author
; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
metallic scatterers, industrial environment, dense multipath scattering, nonline-of-sight scenarios, 3.1 to 10.6 GHz, ray power decay constants, UWB channel, power delay profile, statistical analysis, Saleh-Valenzuela model, Rayleigh distributed small-scale fading signal, Nakagami distributions, factory hall
host publication
[Host publication title missing]
pages
81 - 85
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
IEEE Vehicular Technology Conference (VTC2004-fall)
conference location
Los Angeles, CA, United States
conference dates
2004-09-26 - 2004-09-29
external identifiers
  • wos:000227931900018
  • scopus:17144402595
ISBN
0-7803-8521-7
DOI
10.1109/VETECF.2004.1399930
language
English
LU publication?
yes
id
8fbf1d4d-7b13-48b9-9ff3-e2a0e1be39d8 (old id 614579)
date added to LUP
2016-04-04 11:08:32
date last changed
2022-04-24 00:14:06
@inproceedings{8fbf1d4d-7b13-48b9-9ff3-e2a0e1be39d8,
  abstract     = {{In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger distances, several hundred multipath components need to be collected to capture 50% of the available energy}},
  author       = {{Kåredal, Johan and Wyne, Shurjeel and Almers, Peter and Tufvesson, Fredrik and Molisch, Andreas}},
  booktitle    = {{[Host publication title missing]}},
  isbn         = {{0-7803-8521-7}},
  keywords     = {{metallic scatterers; industrial environment; dense multipath scattering; nonline-of-sight scenarios; 3.1 to 10.6 GHz; ray power decay constants; UWB channel; power delay profile; statistical analysis; Saleh-Valenzuela model; Rayleigh distributed small-scale fading signal; Nakagami distributions; factory hall}},
  language     = {{eng}},
  pages        = {{81--85}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{Statistical analysis of the UWB channel in an industrial environment}},
  url          = {{https://lup.lub.lu.se/search/files/5703970/1291569.pdf}},
  doi          = {{10.1109/VETECF.2004.1399930}},
  year         = {{2004}},
}