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Statistical analysis of the UWB channel in an industrial environment

Kåredal, Johan LU ; Wyne, Shurjeel LU ; Almers, Peter LU ; Tufvesson, Fredrik LU and Molisch, Andreas LU (2004) IEEE Vehicular Technology Conference (VTC2004-fall) In [Host publication title missing] p.81-85
Abstract
In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger... (More)
In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger distances, several hundred multipath components need to be collected to capture 50% of the available energy (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
metallic scatterers, industrial environment, dense multipath scattering, nonline-of-sight scenarios, 3.1 to 10.6 GHz, ray power decay constants, UWB channel, power delay profile, statistical analysis, Saleh-Valenzuela model, Rayleigh distributed small-scale fading signal, Nakagami distributions, factory hall
in
[Host publication title missing]
pages
81 - 85
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
IEEE Vehicular Technology Conference (VTC2004-fall)
external identifiers
  • WOS:000227931900018
  • Scopus:17144402595
ISBN
0-7803-8521-7
DOI
10.1109/VETECF.2004.1399930
language
English
LU publication?
yes
id
8fbf1d4d-7b13-48b9-9ff3-e2a0e1be39d8 (old id 614579)
date added to LUP
2007-11-27 12:39:12
date last changed
2016-11-20 04:26:45
@misc{8fbf1d4d-7b13-48b9-9ff3-e2a0e1be39d8,
  abstract     = {In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger distances, several hundred multipath components need to be collected to capture 50% of the available energy},
  author       = {Kåredal, Johan and Wyne, Shurjeel and Almers, Peter and Tufvesson, Fredrik and Molisch, Andreas},
  isbn         = {0-7803-8521-7},
  keyword      = {metallic scatterers,industrial environment,dense multipath scattering,nonline-of-sight scenarios,3.1 to 10.6 GHz,ray power decay constants,UWB channel,power delay profile,statistical analysis,Saleh-Valenzuela model,Rayleigh distributed small-scale fading signal,Nakagami distributions,factory hall},
  language     = {eng},
  pages        = {81--85},
  publisher    = {ARRAY(0x908d000)},
  series       = {[Host publication title missing]},
  title        = {Statistical analysis of the UWB channel in an industrial environment},
  url          = {http://dx.doi.org/10.1109/VETECF.2004.1399930},
  year         = {2004},
}