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Cathodoluminescence for studies of low dimensional semiconductor structures

Gustafsson, Anders LU orcid (2002) Microscopy of Semiconducting Materials XII 169. p.547-556
Abstract
Cathodoluminescence (CL) is a very powerful technique for studying the optical properties of semiconductor structures, especially low-dimensional structures (structures with sub-micron features). We will give a number of examples of studies, where CL has been used to study a variety of low-dimensional semiconductor structures. We will also compare the CL technique with other techniques for studies of luminescence with high spatial resolution.
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Institute of Physics Conference Series
editor
Tony, Cullis
volume
169
pages
10 pages
publisher
IOP Publishing
conference name
Microscopy of Semiconducting Materials XII
conference location
Oxford, United Kingdom
conference dates
2001-03-26
language
English
LU publication?
yes
id
41f9de9c-4ad8-48a8-a769-5e851f666fdf (old id 794552)
date added to LUP
2016-04-04 11:51:59
date last changed
2018-11-21 21:07:42
@inproceedings{41f9de9c-4ad8-48a8-a769-5e851f666fdf,
  abstract     = {{Cathodoluminescence (CL) is a very powerful technique for studying the optical properties of semiconductor structures, especially low-dimensional structures (structures with sub-micron features). We will give a number of examples of studies, where CL has been used to study a variety of low-dimensional semiconductor structures. We will also compare the CL technique with other techniques for studies of luminescence with high spatial resolution.}},
  author       = {{Gustafsson, Anders}},
  booktitle    = {{Institute of Physics Conference Series}},
  editor       = {{Tony, Cullis}},
  language     = {{eng}},
  pages        = {{547--556}},
  publisher    = {{IOP Publishing}},
  title        = {{Cathodoluminescence for studies of low dimensional semiconductor structures}},
  volume       = {{169}},
  year         = {{2002}},
}