Advanced

EL2-Maps from Computer Based Image Analysis of Semi-Insulating GaAs Wafers

Nielsen, Lars; Samuelsson, Lars; Omling, Pär LU and Silverberg, Per (1985) Symposium on Defect Recognition and Image Processing in III-V Compounds
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to conference
publication status
published
subject
conference name
Symposium on Defect Recognition and Image Processing in III-V Compounds
external identifiers
  • Scopus:0022282360
language
English
LU publication?
yes
id
983cf9e8-7884-464c-b5c5-3a503436b2f0 (old id 8517879)
date added to LUP
2016-02-05 09:43:06
date last changed
2016-04-16 11:56:22
@misc{983cf9e8-7884-464c-b5c5-3a503436b2f0,
  author       = {Nielsen, Lars and Samuelsson, Lars and Omling, Pär and Silverberg, Per},
  language     = {eng},
  title        = {EL2-Maps from Computer Based Image Analysis of Semi-Insulating GaAs Wafers},
  year         = {1985},
}