Advanced

Thickness dependence of photoemission and X-ray fluorescence spectra in epitaxial NiO layers on Ag(100)

Krasnikov, S. A.; Preobrajenski, Alexei LU ; Chasse, T. and Szargan, R. (2003) In Thin Solid Films 428. p.201-205
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Thin Solid Films
volume
428
pages
201 - 205
publisher
Elsevier
external identifiers
  • Scopus:0037457163
ISSN
0040-6090
language
English
LU publication?
yes
id
e1c5484e-2188-43fa-92a8-c9a6e4aa95c4 (old id 976208)
date added to LUP
2012-05-30 20:26:44
date last changed
2016-10-13 04:55:40
@misc{e1c5484e-2188-43fa-92a8-c9a6e4aa95c4,
  author       = {Krasnikov, S. A. and Preobrajenski, Alexei and Chasse, T. and Szargan, R.},
  issn         = {0040-6090},
  language     = {eng},
  pages        = {201--205},
  publisher    = {ARRAY(0x9a435d8)},
  series       = {Thin Solid Films},
  title        = {Thickness dependence of photoemission and X-ray fluorescence spectra in epitaxial NiO layers on Ag(100)},
  volume       = {428},
  year         = {2003},
}