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Soft-x-ray polarimeter with multilayer optics : Complete analysis of the polarization state of light

Schäfers, Franz; Mertins, Hans Christoph; Gaupp, Andreas LU ; Gudat, Wolfgang; Mertin, Marcel; Packe, Ingo; Schmolla, Frank; Di Fonzo, Silvia; Soullié, Gérard and Jark, Werner, et al. (1999) In Applied Optics 38(19). p.4074-4088
Abstract

The design of a versatile high-precision eight-axis ultrahigh-vacuum-compatible polarimeter is presented. This multipurpose instrument can be used as a self-calibrating polarization detector for linearly and circularly polarized UV and soft-x-ray light. It can also be used for the characterization of reflection or transmission properties (reflectometer) or polarizing and phase-retarding properties (ellipsometer) of any optical element. The polarization properties of Mo/Si, Cr/C, Cr/Sc, and Ni/Ti multilayers used in this polarimeter as polarizers in transmission and as analyzers in reflection have been investigated theoretically and experimentally. In the soft-x-ray range, close to the 2p edges of Sc, Ti, and Cr, resonantly enhanced... (More)

The design of a versatile high-precision eight-axis ultrahigh-vacuum-compatible polarimeter is presented. This multipurpose instrument can be used as a self-calibrating polarization detector for linearly and circularly polarized UV and soft-x-ray light. It can also be used for the characterization of reflection or transmission properties (reflectometer) or polarizing and phase-retarding properties (ellipsometer) of any optical element. The polarization properties of Mo/Si, Cr/C, Cr/Sc, and Ni/Ti multilayers used in this polarimeter as polarizers in transmission and as analyzers in reflection have been investigated theoretically and experimentally. In the soft-x-ray range, close to the 2p edges of Sc, Ti, and Cr, resonantly enhanced phase retardation of the transmission polarizers of as much as 18° has been measured. With these newly developed optical elements the complete polarization analysis of soft-x-ray synchrotron radiation can be extended to the water-window range from 300 to 600 eV. ©1999 Optical Society of America.

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Applied Optics
volume
38
issue
19
pages
15 pages
publisher
OSA
external identifiers
  • Scopus:18044401838
ISSN
0003-6935
language
English
LU publication?
yes
id
a17e1056-0c1a-4fcc-bfdc-f9755b88bab5
date added to LUP
2016-04-27 16:43:59
date last changed
2016-10-13 05:07:08
@misc{a17e1056-0c1a-4fcc-bfdc-f9755b88bab5,
  abstract     = {<p>The design of a versatile high-precision eight-axis ultrahigh-vacuum-compatible polarimeter is presented. This multipurpose instrument can be used as a self-calibrating polarization detector for linearly and circularly polarized UV and soft-x-ray light. It can also be used for the characterization of reflection or transmission properties (reflectometer) or polarizing and phase-retarding properties (ellipsometer) of any optical element. The polarization properties of Mo/Si, Cr/C, Cr/Sc, and Ni/Ti multilayers used in this polarimeter as polarizers in transmission and as analyzers in reflection have been investigated theoretically and experimentally. In the soft-x-ray range, close to the 2p edges of Sc, Ti, and Cr, resonantly enhanced phase retardation of the transmission polarizers of as much as 18° has been measured. With these newly developed optical elements the complete polarization analysis of soft-x-ray synchrotron radiation can be extended to the water-window range from 300 to 600 eV. ©1999 Optical Society of America.</p>},
  author       = {Schäfers, Franz and Mertins, Hans Christoph and Gaupp, Andreas and Gudat, Wolfgang and Mertin, Marcel and Packe, Ingo and Schmolla, Frank and Di Fonzo, Silvia and Soullié, Gérard and Jark, Werner and Walker, Richard and Le Cann, Xavier and Nyholm, Ralf and Eriksson, Mikael},
  issn         = {0003-6935},
  language     = {eng},
  month        = {07},
  number       = {19},
  pages        = {4074--4088},
  publisher    = {ARRAY(0xa7fff30)},
  series       = {Applied Optics},
  title        = {Soft-x-ray polarimeter with multilayer optics : Complete analysis of the polarization state of light},
  volume       = {38},
  year         = {1999},
}