LUP Statistics
Record
- Title
- Low-Temperature Front-Side BEOL Technology with Circuit Level Multiline Thru-Reflect-Line Kit for III-V MOSFETs on Silicon
- Type
- Conference Proceeding/Paper
- Publ. year
- 2019
- Author/s
- Andric, Stefan; Ohlsson, Lars; Wenrersson, Lars Erik
- Department/s
- Nano Electronics
- In LUP since
- 2019-03-28
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