LUP Statistics
Record
- Title
- Effect of Gate Oxide Defects on Tunnel Transistor RF Performance
- Type
- Conference Proceeding/Paper
- Publ. year
- 2018
- Author/s
- Hellenbrand, Markus; Memisevic, Elvedin; Svensson, Johannes; Krishnaraja, Abinaya et al.
- Department/s
- Department of Electrical and Information Technology; Nano Electronics; NanoLund: Centre for Nanoscience
- In LUP since
- 2018-07-24
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