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Record
Title
Electrical characterization of thin InAs films grown on patterned W/GaAs substrates
Type
Journal Article
Publ. year
2009
Author/s
Astromskas, Gvidas; Wallenberg, Reine; Wernersson, Lars-Erik
Department/s
Solid State Physics; Centre for Analysis and Synthesis; Department of Electrical and Information Technology; Nano-lup-obsolete
In LUP since
2016-04-01
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711 14 2
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United States of America 302 (42%)
Germany 84 (12%)
Russian Federation 41 (6%)
China 39 (5%)
Sweden 26 (4%)
Japan 25 (4%)
Czechia 21 (3%)
France 16 (2%)
Taiwan (China) 15 (2%)
South Korea 15 (2%)
India 13 (2%)
Hungary 9 (1%)
United Kingdom of Great Britain and Northern Ireland 8 (1%)
Canada 7 (1%)
Poland 7 (1%)
Hong Kong (China) 5 (1%)
Saudi Arabia 5 (1%)
Singapore 4 (1%)
Denmark 4 (1%)
Lithuania 4 (1%)
Italy 4 (1%)
Ukraine 4 (1%)
European Union location 3 (0%)
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Morocco 3 (0%)
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Iran 3 (0%)
Greece 3 (0%)
Iraq 3 (0%)
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Spain 2 (0%)
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Turkiye 1 (0%)
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Unknown 1 (0%)
Mexico 1 (0%)
Pakistan 1 (0%)
United Arab Emirates 1 (0%)
Australia 1 (0%)
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The download statistics shown here have been collected since the launch of LUP in October 2007 and are updated every night. Statistics are available for all records with open access fulltexts. Efforts have been made to exclude downloads by robots and track irregular download activities.

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The information on downloads per country is based on the geolocation of IP addresses and may not be completely accurate. The statistics presented here may also change retroactively when the calculation process is improved to provide more accurate results.

Statistics Last Updated
Wed Aug 27 08:44:42 2025