Skip to main content
Record
Title
A High-Frequency Transconductance Method for Characterization of High-k Border Traps in III-V MOSFETs
Type
Journal Article
Publ. year
2013
Author/s
Johansson, Sofia; Berg, Martin; Persson, Karl-Magnus; Lind, Erik
Department/s
Solid State Physics; Department of Electrical and Information Technology; NanoLund: Centre for Nanoscience
In LUP since
2016-04-01
Downloads

Total This Year This Month
1323 22 0
Downloads per country

United States of America 315 (24%)
India 124 (9%)
United Kingdom of Great Britain and Northern Ireland 106 (8%)
Germany 95 (7%)
Sweden 89 (7%)
Taiwan (China) 83 (6%)
South Korea 79 (6%)
China 59 (4%)
Japan 51 (4%)
Russian Federation 31 (2%)
France 30 (2%)
Netherlands (Kingdom of the) 20 (2%)
Czechia 19 (1%)
Italy 19 (1%)
Belgium 15 (1%)
Canada 13 (1%)
Hong Kong (China) 13 (1%)
Ireland 11 (1%)
Iran 11 (1%)
Singapore 11 (1%)
Turkiye 8 (1%)
Malaysia 7 (1%)
Greece 7 (1%)
Australia 7 (1%)
Spain 7 (1%)
Finland 7 (1%)
Brazil 6 (0%)
Tunisia 5 (0%)
Mexico 5 (0%)
Algeria 5 (0%)
Austria 5 (0%)
Ukraine 5 (0%)
Romania 4 (0%)
Egypt 4 (0%)
Israel 4 (0%)
Norway 3 (0%)
Pakistan 3 (0%)
Philippines 3 (0%)
Bangladesh 3 (0%)
Portugal 3 (0%)
Malta 3 (0%)
Poland 3 (0%)
Switzerland 2 (0%)
Hungary 2 (0%)
Lithuania 2 (0%)
Unknown 2 (0%)
Morocco 2 (0%)
Lebanon 2 (0%)
Argentina 1 (0%)
Croatia 1 (0%)
United Arab Emirates 1 (0%)
Uruguay 1 (0%)
Puerto Rico 1 (0%)
Serbia 1 (0%)
Estonia 1 (0%)
Saudi Arabia 1 (0%)
Colombia 1 (0%)
European Union location 1 (0%)
Macedonia 1 (0%)
South Africa 1 (0%)
About
The download statistics shown here have been collected since the launch of LUP in October 2007 and are updated every night. Statistics are available for all records with open access fulltexts. Efforts have been made to exclude downloads by robots and track irregular download activities.

About accessibility

Disclaimer
The information on downloads per country is based on the geolocation of IP addresses and may not be completely accurate. The statistics presented here may also change retroactively when the calculation process is improved to provide more accurate results.

Statistics Last Updated
Sun Dec 14 08:24:36 2025