LUP Statistics
Record
- Title
- A Self-aligned Gate-last Process applied to All-III-V CMOS on Si
- Type
- Journal Article
- Publ. year
- 2018
- Author/s
- Jonsson, Adam; Svensson, Johannes; Wernersson, Lars Erik
- Department/s
- Department of Electrical and Information Technology
- In LUP since
- 2018-05-29
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