LUP Statistics
Record
- Title
- Test Planning and Test Access Mechanism Design for Stacked Chips using ILP
- Type
- Conference Proceeding/Paper
- Publ. year
- 2014
- Author/s
- Sengupta, Breeta; Larsson, Erik
- Department/s
- Department of Electrical and Information Technology; Digital ASIC-lup-obsolete
- In LUP since
- 2016-04-01
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