LUP Statistics
Record
- Title
- On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology.
- Type
- Journal Article
- Publ. year
- 2014
- Author/s
- Siewert, F; Buchheim, J; Zeschke, T; Störmer, M et al.
- Department/s
- MAX IV Laboratory
- In LUP since
- 2016-04-01
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