LUP Statistics
Record
- Title
- Capacitance Measurements in Vertical III-V Nanowire TFETs
- Type
- Journal Article
- Publ. year
- 2018
- Author/s
- Hellenbrand, Markus; Memisevic, Elvedin; Svensson, Johannes; Krishnaraja, Abinaya et al.
- Department/s
- Department of Electrical and Information Technology; Nano Electronics
- In LUP since
- 2018-05-09
Downloads
| Total | This Year | This Month |
| 361 | 8 | 0 |
United States of America  |
223 (62%) |
Sweden  |
25 (7%) |
India  |
20 (6%) |
Germany  |
20 (6%) |
China  |
17 (5%) |
France  |
9 (2%) |
United Kingdom of Great Britain and Northern Ireland  |
7 (2%) |
Netherlands (Kingdom of the)  |
6 (2%) |
Hong Kong (China)  |
5 (1%) |
Romania  |
3 (1%) |
Unknown  |
3 (1%) |
Singapore  |
2 (1%) |
Lithuania  |
2 (1%) |
South Africa  |
2 (1%) |
Belgium  |
2 (1%) |
Ukraine  |
1 (0%) |
Taiwan (China)  |
1 (0%) |
Indonesia  |
1 (0%) |
Ireland  |
1 (0%) |
Iran  |
1 (0%) |
Denmark  |
1 (0%) |
Czechia  |
1 (0%) |
Canada  |
1 (0%) |
Russian Federation  |
1 (0%) |
Viet Nam  |
1 (0%) |
Croatia  |
1 (0%) |
Brazil  |
1 (0%) |
Estonia  |
1 (0%) |
Seychelles  |
1 (0%) |
South Korea  |
1 (0%) |