LUP Statistics
Record
- Title
- Low-Frequency Noise in Vertical InAs/InGaAs Gate-All-Around MOSFETs at 15 K for Cryogenic Applications
- Type
- Journal Article
- Publ. year
- 2022
- Author/s
- Mamidala, Saketh, Ram; Svensson, Johannes; Skog, Sebastian; Johannesson, Sofie et al.
- Department/s
- Nano Electronics; LTH Profile Area: AI and Digitalization; Department of Electrical and Information Technology; LTH Profile Area: Nanoscience and Semiconductor Technology; NanoLund: Centre for Nanoscience
- In LUP since
- 2022-11-30
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