LUP Statistics
Record
- Title
- Comparison of Low-Frequency Noise in Nanowire and Planar III-V MOSFETs
- Type
- Contribution to Conference
- Publ. year
- 2019
- Author/s
- Hellenbrand, Markus; Kilpi, Olli-Pekka; Svensson, Johannes; Lind, Erik et al.
- Department/s
- Department of Electrical and Information Technology; Nano Electronics; NanoLund: Centre for Nanoscience
- In LUP since
- 2019-07-22
Downloads
| Total | This Year | This Month |
| 80 | 1 | 0 |
Sweden  |
18 (23%) |
United States of America  |
14 (18%) |
Germany  |
10 (13%) |
France  |
8 (10%) |
China  |
7 (9%) |
Unknown  |
3 (4%) |
Taiwan (China)  |
3 (4%) |
Netherlands (Kingdom of the)  |
3 (4%) |
Russian Federation  |
2 (3%) |
Hong Kong (China)  |
2 (3%) |
India  |
2 (3%) |
Greece  |
1 (1%) |
Iran  |
1 (1%) |
Philippines  |
1 (1%) |
Czechia  |
1 (1%) |
Denmark  |
1 (1%) |
Singapore  |
1 (1%) |
United Kingdom of Great Britain and Northern Ireland  |
1 (1%) |
Finland  |
1 (1%) |