LUP Statistics
Record
- Title
- Test Cost Reduction of 3D Stacked ICs : Test Planning and Test Flow Selection
- Type
- Dissertation
- Publ. year
- 2020
- Author/s
- Sengupta, Breeta
- Department/s
- Integrated Electronic Systems
- In LUP since
- 2020-06-12
Downloads
| Total | This Year | This Month |
| 347 | 24 | 5 |
United States of America  |
64 (18%) |
China  |
53 (15%) |
India  |
36 (10%) |
Russian Federation  |
32 (9%) |
Sweden  |
29 (8%) |
Taiwan (China)  |
23 (7%) |
Malaysia  |
19 (5%) |
France  |
13 (4%) |
Japan  |
9 (3%) |
Germany  |
9 (3%) |
Czechia  |
8 (2%) |
Hong Kong (China)  |
5 (1%) |
South Korea  |
5 (1%) |
Singapore  |
4 (1%) |
Netherlands (Kingdom of the)  |
3 (1%) |
Indonesia  |
2 (1%) |
Iran  |
2 (1%) |
Australia  |
2 (1%) |
Nigeria  |
2 (1%) |
Canada  |
2 (1%) |
Finland  |
2 (1%) |
Ireland  |
2 (1%) |
Viet Nam  |
2 (1%) |
Denmark  |
1 (0%) |
Philippines  |
1 (0%) |
Romania  |
1 (0%) |
Italy  |
1 (0%) |
Poland  |
1 (0%) |
Azerbaijan  |
1 (0%) |
Belgium  |
1 (0%) |
United Kingdom of Great Britain and Northern Ireland  |
1 (0%) |
Thailand  |
1 (0%) |
Brazil  |
1 (0%) |
Bangladesh  |
1 (0%) |
Chile  |
1 (0%) |
Iraq  |
1 (0%) |
Unknown  |
1 (0%) |
Spain  |
1 (0%) |
Luxembourg  |
1 (0%) |
Pakistan  |
1 (0%) |
Mexico  |
1 (0%) |
Israel  |
1 (0%) |