LUP Statistics
Record
- Title
- Test Cost Reduction of 3D Stacked ICs : Test Planning and Test Flow Selection
- Type
- Dissertation
- Publ. year
- 2020
- Author/s
- Sengupta, Breeta
- Department/s
- Integrated Electronic Systems
- In LUP since
- 2020-06-12
Downloads
| Total | This Year | This Month |
| 300 | 43 | 3 |
China  |
51 (17%) |
United States of America  |
50 (17%) |
India  |
32 (11%) |
Russian Federation  |
30 (10%) |
Sweden  |
26 (9%) |
Malaysia  |
19 (6%) |
Taiwan (China)  |
18 (6%) |
France  |
13 (4%) |
Germany  |
8 (3%) |
Japan  |
8 (3%) |
Czechia  |
7 (2%) |
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4 (1%) |
South Korea  |
3 (1%) |
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3 (1%) |
Canada  |
2 (1%) |
Finland  |
2 (1%) |
Ireland  |
2 (1%) |
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1 (0%) |
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