LUP Statistics
Record
- Title
- Low-Frequency Noise in Nanowire and Planar III-V MOSFETs
- Type
- Journal Article
- Publ. year
- 2019
- Author/s
- Hellenbrand, Markus; Kilpi, Olli-Pekka; Svensson, Johannes; Lind, Erik et al.
- Department/s
- Department of Electrical and Information Technology; Nano Electronics; NanoLund: Centre for Nanoscience
- In LUP since
- 2019-05-20
Downloads
Total | This Year | This Month |
264 | 37 | 3 |
United States of America | 122 (47%) |
Sweden | 35 (13%) |
Germany | 23 (9%) |
China | 16 (6%) |
France | 11 (4%) |
Hong Kong (China) | 6 (2%) |
India | 5 (2%) |
Taiwan (China) | 5 (2%) |
United Kingdom of Great Britain and Northern Ireland | 5 (2%) |
Netherlands (Kingdom of the) | 3 (1%) |
Russian Federation | 3 (1%) |
Unknown | 3 (1%) |
South Korea | 3 (1%) |
Italy | 2 (1%) |
Canada | 2 (1%) |
Singapore | 2 (1%) |
Iran | 2 (1%) |
Japan | 2 (1%) |
Finland | 2 (1%) |
Ireland | 1 (0%) |
Denmark | 1 (0%) |
Czechia | 1 (0%) |
Spain | 1 (0%) |
Algeria | 1 (0%) |
Egypt | 1 (0%) |
Yemen | 1 (0%) |
Senegal | 1 (0%) |
Estonia | 1 (0%) |