LUP Statistics
Record
- Title
- Impact of Temperature-Induced Oxide Defects on HfxZr1−xO2 Ferroelectric Tunnel Junction Memristor Performance
- Type
- Journal Article
- Publ. year
- 2023
- Author/s
- Athle, Robin; Borg, Mattias
- Department/s
- Nano Electronics; NanoLund: Centre for Nanoscience; LTH Profile Area: AI and Digitalization; LTH Profile Area: Nanoscience and Semiconductor Technology; LU Profile Area: Light and Materials
- In LUP since
- 2023-03-10
Downloads
Total | This Year | This Month |
23 | 16 | 0 |
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