Gaia on-board metrology: basic angle and best focus
Mora, A.; Biermann, M.; Brown, A. G. A.; Busonero, D., et al. (2014). Gaia on-board metrology: basic angle and best focus Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave, 9143,, 91430 - 91430. Conference on Space Telescopes and Instrumentation - Optical, Infrared, and Millimeter Wave. Montreal, Canada: SPIE
Conference Proceeding/Paper
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Published
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English
Authors:
Mora, A.
;
Biermann, M.
;
Brown, A. G. A.
;
Busonero, D.
, et al.
Department:
Lund Observatory - Has been reorganised
Abstract:
The Gala payload ensures maximum passive stability using a single material, SiC, for most of its elements. Dedicated metrology instruments are, however, required to carry out two functions: monitoring the basic angle and refocusing the telescope. Two interferometers fed by the same laser are used to measure the basic angle changes at the level of pas (prad, micropixel), which is the highest level ever achieved in space. Two ShackHartmann wavefront sensors, combined with an ad-hoc analysis of the scientific data are used to define and reach the overall best-focus. In this contribution, the systems, data analysis, procedures and performance achieved during commissioning are presented
Keywords:
Astrometry ;
Gaia ;
metrology ;
interferometry ;
basic angle monitor ;
wavefront sensor ;
Shack-Hartmann ;
wavefront reconstruction ;
centroid ;
Cramer-Rao ;
spectral resolution
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