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2010
Mark Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
Favre-Nicolin, V. ; Mastropietro, F. ; Eymery, J. ; Camacho, D. ; Niquet, Y. M. ; Borg, Mattias ^LU ; Messing, Maria ^LU ; Wernersson, Lars-Erik ^LU ; Algra, R. E. and Bakkers, E. P. A. M. , et al. (2010) In New Journal of Physics 12.
- Contribution to journal › Article
2006
Mark Imaging few-electron quantum dots in InAs/InP nanowires: imaging experiments
Bleszynski, A C ; Westervelt, R M ; Fröberg, Linus ^LU ; Samuelson, Lars ^LU ; Zwanenburg, F A ; Kouwenhoven, L P ; Roest, A L and Bakkers, E P A M (2006) 28th International Conference On The Physics Of Semiconductors, 2006
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding

your query:: Remove author: Bakkers, E. P. A. M.