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- 2005
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Mark
Development and characterization of silane antisticking layers on nickel-based stamps designed for nanoimprint lithography
(
- Contribution to journal › Article
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Mark
Topas-based lab-on-a-chip microsystems fabricated by thermal nanoimprint lithography
(
- Contribution to journal › Article
- 2004
-
Mark
Process development and characterization of antisticking layers on nickel-based stamps designed for nanoimprint lithography
(
- Contribution to journal › Article
- 2003
-
Mark
Electric field effects in single semiconductor quantum dots observed by scanning tunneling luminescence
(
- Contribution to journal › Article
- 2002
-
Mark
Epitaxially overgrown, stable W-GaAs Schottky contacts with sizes down to 50 nm
(
- Contribution to journal › Article
-
Mark
Scanning photoelectron microscopy study of as-grown and heat-treated chemical vapor deposition boron-doped diamond films
(
- Contribution to journal › Article
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Mark
Investigation of polymethylmethacrylate resist residues using photoelectron microscopy
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Ultrahigh vacuum scanning probe investigations of metal induced void formation in SiO2/Si(111))
2002) 6th International Workshop on Fabrication, Characterization, and Modeling of Ultra-Shallow Doping Profiles in Semiconductors 20(1). p.226-229(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 1997
-
Mark
Nanometer table-top proximity x-ray lithography with liquid-target laser-plasma source
(
- Contribution to journal › Article