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- 2010
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Mark
Energy-Efficient Redundant Execution for Chip Multiprocessors
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Scan Cells Reordering to Minimize Peak Power During Test Cycle : A Graph Theoretic Approach
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Optimizing Fault Tolerance for Multi-Processor System-on-Chip
2010)(
- Chapter in Book/Report/Conference proceeding › Book chapter
-
Mark
Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules
2010) IEEE East-West Design and Test Symposium (EWDTS10)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Mapping and Scheduling of Jobs in Homogeneous NoC-based MPSoC
2010) Swedish SoC Conference 2010(
- Contribution to conference › Paper, not in proceeding
- 2009
-
Mark
Fault-Tolerant Average Execution Time Optimization for System-On-Chips
2009) Frontiers of High Performance Embedded Computing(
- Contribution to conference › Paper, not in proceeding
-
Mark
Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules
2009) DATE 2009 Friday Workshop on 3D Integration - Technology, Architecture, Design, Automation, and Tes(
- Contribution to conference › Paper, not in proceeding
-
Mark
An Even-Odd DFD Technique for Scan Chain Diagnosis
2009) Workshop on RTL and High Level Testing (WRTLT)(
- Contribution to conference › Paper, not in proceeding
-
Mark
On Minimization of Peak Power for Scan Circuit during Test
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC
(
- Contribution to conference › Paper, not in proceeding