LUP Statistics
Record
- Title
- Test Cost Reduction of 3D Stacked ICs : Test Planning and Test Flow Selection
- Type
- Dissertation
- Publ. year
- 2020
- Author/s
- Sengupta, Breeta
- Department/s
- Integrated Electronic Systems
- In LUP since
- 2020-06-12
Downloads
| Total | This Year | This Month |
| 437 | 68 | 10 |
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100 (23%) |
China  |
59 (14%) |
India  |
41 (9%) |
Sweden  |
33 (8%) |
Russian Federation  |
32 (7%) |
Taiwan (China)  |
24 (5%) |
Malaysia  |
19 (4%) |
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14 (3%) |
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10 (2%) |
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9 (2%) |
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9 (2%) |
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