LUP Statistics
Record
- Title
- Effects of traps in the gate stack on the small-signal RF response of III-V nanowire MOSFETs
- Type
- Journal Article
- Publ. year
- 2020
- Author/s
- Hellenbrand, Markus; Lind, Erik; Kilpi, Olli-Pekka; Wernersson, Lars-Erik
- Department/s
- Department of Electrical and Information Technology; Nano Electronics; NanoLund: Centre for Nanoscience
- In LUP since
- 2020-05-12
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