Record
Title
Sub-100-nm gate-length scaling of vertical InAs/InGaAs nanowire MOSFETs on Si
Type
Conference Proceeding/Paper
Publ. year
2018
Author/s
Kilpi, Olli Pekka; Svensson, Johannes; Wernersson, Lars Erik
Department/s
Nano Electronics
In LUP since
2018-04-23
Downloads

Total This Year This Month
23 9 3
Downloads per country

Sweden 7 (30%)
China 7 (30%)
Germany 3 (13%)
Finland 2 (9%)
Taiwan (China) 1 (4%)
Japan 1 (4%)
United States of America 1 (4%)
South Korea 1 (4%)
About
The download statistics shown here have been collected since the launch of LUP in October 2007 and are updated every night. Statistics are available for all records with open access fulltexts. Efforts have been made to exclude downloads by robots and track irregular download activities.

Disclaimer
The information on downloads per country is based on the geolocation of IP addresses and may not be completely accurate. The statistics presented here may also change retroactively when the calculation process is improved to provide more accurate results.

Statistics Last Updated
2019-02-21 02:44:45