LUP Statistics
Record
- Title
- Sub-100-nm gate-length scaling of vertical InAs/InGaAs nanowire MOSFETs on Si
- Type
- Conference Proceeding/Paper
- Publ. year
- 2018
- Author/s
- Kilpi, Olli Pekka; Svensson, Johannes; Wernersson, Lars Erik
- Department/s
- Nano Electronics
- In LUP since
- 2018-04-23
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