Advanced

Scanning electron microscope

Freiburghaus, Tove LU ; Förberg, Johan LU ; Goteman, Axel LU and Hagel, Johan LU (2010) FAFA25 20102
Atomic Physics
Department of Physics
Engineering Physics (M.Sc.Eng.)
Please use this url to cite or link to this publication:
author
Freiburghaus, Tove LU ; Förberg, Johan LU ; Goteman, Axel LU and Hagel, Johan LU
supervisor
organization
course
FAFA25 20102
year
type
L3 - Miscellaneous, Projetcs etc.
subject
keywords
SEM, skanningelektronmikroskopi, svepelektronmikroskop
language
Swedish
id
1744012
date added to LUP
2011-01-02 10:30:34
date last changed
2015-12-14 13:32:23
@misc{1744012,
  author       = {Freiburghaus, Tove and Förberg, Johan and Goteman, Axel and Hagel, Johan},
  keyword      = {SEM,skanningelektronmikroskopi,svepelektronmikroskop},
  language     = {swe},
  note         = {Student Paper},
  title        = {Scanning electron microscope},
  year         = {2010},
}