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Electro-Optical Characterization of Individual upright-standing Nanowires using Atomic Force Microscopy

Cai, Wenjing LU (2013) PHYM01 20131
Atomic Physics
Mathematical Physics
Abstract
This diploma thesis describes the experimental sessions carried out step by step towards the final aim of implementing the electrical characterization and luminescence detection on individual upright-standing nanowires in LED or solar cell nanowire arrays using a conductive Atomic Force Microscope (C-AFM) instrument. The whole lab work covers various characterization procedures of single nanowires including topography imaging, current mapping, I (V) curve measuring as well as electroluminescence detecting. As one of the key factors in electrical measurements, the control of the contact between the tip and sample has received special attention in the project. The proper choice of various AFM parameters and recommendations for future sample... (More)
This diploma thesis describes the experimental sessions carried out step by step towards the final aim of implementing the electrical characterization and luminescence detection on individual upright-standing nanowires in LED or solar cell nanowire arrays using a conductive Atomic Force Microscope (C-AFM) instrument. The whole lab work covers various characterization procedures of single nanowires including topography imaging, current mapping, I (V) curve measuring as well as electroluminescence detecting. As one of the key factors in electrical measurements, the control of the contact between the tip and sample has received special attention in the project. The proper choice of various AFM parameters and recommendations for future sample properties are discussed. (Less)
Please use this url to cite or link to this publication:
author
Cai, Wenjing LU
supervisor
organization
course
PHYM01 20131
year
type
H2 - Master's Degree (Two Years)
subject
keywords
AFM, solar cells, nanowires, electrical characterization, optical characterization
language
English
id
4017687
date added to LUP
2013-10-31 14:32:24
date last changed
2015-12-14 13:32:32
@misc{4017687,
  abstract     = {This diploma thesis describes the experimental sessions carried out step by step towards the final aim of implementing the electrical characterization and luminescence detection on individual upright-standing nanowires in LED or solar cell nanowire arrays using a conductive Atomic Force Microscope (C-AFM) instrument. The whole lab work covers various characterization procedures of single nanowires including topography imaging, current mapping, I (V) curve measuring as well as electroluminescence detecting. As one of the key factors in electrical measurements, the control of the contact between the tip and sample has received special attention in the project. The proper choice of various AFM parameters and recommendations for future sample properties are discussed.},
  author       = {Cai, Wenjing},
  keyword      = {AFM,solar cells,nanowires,electrical characterization,optical characterization},
  language     = {eng},
  note         = {Student Paper},
  title        = {Electro-Optical Characterization of Individual upright-standing Nanowires using Atomic Force Microscopy},
  year         = {2013},
}