Electro-Optical Characterization of Individual upright-standing Nanowires using Atomic Force Microscopy
(2013) PHYM01 20131Atomic Physics
Mathematical Physics
- Abstract
- This diploma thesis describes the experimental sessions carried out step by step towards the final aim of implementing the electrical characterization and luminescence detection on individual upright-standing nanowires in LED or solar cell nanowire arrays using a conductive Atomic Force Microscope (C-AFM) instrument. The whole lab work covers various characterization procedures of single nanowires including topography imaging, current mapping, I (V) curve measuring as well as electroluminescence detecting. As one of the key factors in electrical measurements, the control of the contact between the tip and sample has received special attention in the project. The proper choice of various AFM parameters and recommendations for future sample... (More)
- This diploma thesis describes the experimental sessions carried out step by step towards the final aim of implementing the electrical characterization and luminescence detection on individual upright-standing nanowires in LED or solar cell nanowire arrays using a conductive Atomic Force Microscope (C-AFM) instrument. The whole lab work covers various characterization procedures of single nanowires including topography imaging, current mapping, I (V) curve measuring as well as electroluminescence detecting. As one of the key factors in electrical measurements, the control of the contact between the tip and sample has received special attention in the project. The proper choice of various AFM parameters and recommendations for future sample properties are discussed. (Less)
Please use this url to cite or link to this publication:
http://lup.lub.lu.se/student-papers/record/4017687
- author
- Cai, Wenjing LU
- supervisor
-
- Rainer Timm LU
- organization
- course
- PHYM01 20131
- year
- 2013
- type
- H2 - Master's Degree (Two Years)
- subject
- keywords
- AFM, solar cells, nanowires, electrical characterization, optical characterization
- language
- English
- id
- 4017687
- date added to LUP
- 2013-10-31 14:32:24
- date last changed
- 2015-12-14 13:32:32
@misc{4017687, abstract = {{This diploma thesis describes the experimental sessions carried out step by step towards the final aim of implementing the electrical characterization and luminescence detection on individual upright-standing nanowires in LED or solar cell nanowire arrays using a conductive Atomic Force Microscope (C-AFM) instrument. The whole lab work covers various characterization procedures of single nanowires including topography imaging, current mapping, I (V) curve measuring as well as electroluminescence detecting. As one of the key factors in electrical measurements, the control of the contact between the tip and sample has received special attention in the project. The proper choice of various AFM parameters and recommendations for future sample properties are discussed.}}, author = {{Cai, Wenjing}}, language = {{eng}}, note = {{Student Paper}}, title = {{Electro-Optical Characterization of Individual upright-standing Nanowires using Atomic Force Microscopy}}, year = {{2013}}, }