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All solid state single-shot Dispersion scan (D-Scan) for ultrashort laser pulses

Jadhav, Shekhar LU (2019) FYSM60 20191
Atomic Physics
Department of Physics
Abstract (Swedish)
Ultrashort laser pulses play an important role in many applications in science and technology, from attosecond science to time resolved spectroscopy and material processing. For applications of ultrashort laser pulses, it requires a complete characterization of the electric field of the pulse, which includes both phase and amplitude of the electric field. The characterization of ultrashort laser pulses is very challenging, since we do not have a detector fast enough to measure electric field variations on short time scales such as femtoseconds. A novel characterization technique for ultrashort laser pulses, the dispersion scan (d-scan), was recently developed in Lund.

Here, a new compact single-shot version of the d-scan called... (More)
Ultrashort laser pulses play an important role in many applications in science and technology, from attosecond science to time resolved spectroscopy and material processing. For applications of ultrashort laser pulses, it requires a complete characterization of the electric field of the pulse, which includes both phase and amplitude of the electric field. The characterization of ultrashort laser pulses is very challenging, since we do not have a detector fast enough to measure electric field variations on short time scales such as femtoseconds. A novel characterization technique for ultrashort laser pulses, the dispersion scan (d-scan), was recently developed in Lund.

Here, a new compact single-shot version of the d-scan called Single-Shot d-scan (Si-scan) was developed, to extend the characterization technique to broader spectral range and longer durations. This technique employs a Transverse Second Harmonic Generation (TSHG) crystal which introduces dispersion as well as generating the second harmonic, resulting in a D-scan trace, i.e. SHG spectrum as a function of dispersion. The spectral phase can be retrieved from the D-scan trace by using a phase retrieval algorithm. Within the course of this work, the dispersion properties of the TSHG crystal were measured by using white-light spectral interferometry. A compact imaging spectrometer to measure the Si-scan trace by using the cross Czerny-Turner imaging spectrometer technique, which has very low astigmatism, was build. D-scans recorded with the new system are presented. (Less)
Popular Abstract
The human eye can clearly observe movements as fast as around 0.1 seconds long, but how can we observe the movement that is way too fast for the human eye? For example, you can barely read any labels from a really fast moving formula 1 car. However, if we use a camera which can act faster than the human eye, we can capture the images of the moving object. When a camera takes a picture, it records all the light reaching the detector during the exposure time. To acquire a very sharp image we need a short flash of light which has a shorter duration than the motion. The shorter the light pulses, the faster the movements that can be observed. Similarly, the movement of electrons around an atomic nucleus is on the timescale of attosecond (10^−18... (More)
The human eye can clearly observe movements as fast as around 0.1 seconds long, but how can we observe the movement that is way too fast for the human eye? For example, you can barely read any labels from a really fast moving formula 1 car. However, if we use a camera which can act faster than the human eye, we can capture the images of the moving object. When a camera takes a picture, it records all the light reaching the detector during the exposure time. To acquire a very sharp image we need a short flash of light which has a shorter duration than the motion. The shorter the light pulses, the faster the movements that can be observed. Similarly, the movement of electrons around an atomic nucleus is on the timescale of attosecond (10^−18 s, or 0.000000000000000001 seconds), hence we need an attosecond light pulse to observe their motion. Thus, the development of such short light sources is essential for observing the fast motions.

Ultrashort laser pulses play an important role in many applications, such as laser eye surgery, microscopy, data storage etc. Since ultrashort laser pulses are artificially created, even shorter pulses are not available to measure them, so the pulses themselves have to be used. We further develop a recent technique called Dispersion scan (D-scan) to measure the duration of ultrashort laser pulses. (Less)
Please use this url to cite or link to this publication:
author
Jadhav, Shekhar LU
supervisor
organization
course
FYSM60 20191
year
type
H2 - Master's Degree (Two Years)
subject
keywords
Dispersion scan, d-scan, Single shot d-scan, Si-scan
language
English
id
8987907
date added to LUP
2019-06-26 09:33:43
date last changed
2019-06-26 09:33:43
@misc{8987907,
  abstract     = {{Ultrashort laser pulses play an important role in many applications in science and technology, from attosecond science to time resolved spectroscopy and material processing. For applications of ultrashort laser pulses, it requires a complete characterization of the electric field of the pulse, which includes both phase and amplitude of the electric field. The characterization of ultrashort laser pulses is very challenging, since we do not have a detector fast enough to measure electric field variations on short time scales such as femtoseconds. A novel characterization technique for ultrashort laser pulses, the dispersion scan (d-scan), was recently developed in Lund.

Here, a new compact single-shot version of the d-scan called Single-Shot d-scan (Si-scan) was developed, to extend the characterization technique to broader spectral range and longer durations. This technique employs a Transverse Second Harmonic Generation (TSHG) crystal which introduces dispersion as well as generating the second harmonic, resulting in a D-scan trace, i.e. SHG spectrum as a function of dispersion. The spectral phase can be retrieved from the D-scan trace by using a phase retrieval algorithm. Within the course of this work, the dispersion properties of the TSHG crystal were measured by using white-light spectral interferometry. A compact imaging spectrometer to measure the Si-scan trace by using the cross Czerny-Turner imaging spectrometer technique, which has very low astigmatism, was build. D-scans recorded with the new system are presented.}},
  author       = {{Jadhav, Shekhar}},
  language     = {{eng}},
  note         = {{Student Paper}},
  title        = {{All solid state single-shot Dispersion scan (D-Scan) for ultrashort laser pulses}},
  year         = {{2019}},
}