Embedded functional testing using LabVIEW
(2017)Computer Science and Engineering (BSc)
- Abstract
- The past decade, advancements in semiconductor technology as well as the construction of large data centers around the world have given rise to the possibility to connect anything to the internet. In today’s electronics industry, “Internet-of-things”-applications are in a huge demand where companies are being subject to massive competition. Given this reality, resources within a small development company need to be managed carefully and optimally. In this project, LabVIEW is used to develop a rig for automation of the previously time-consuming task of testing. The project has resulted in the benefits of faster test throughput and a more systematic testing procedure, enabling both development and sales staff to make faster and more... (More)
- The past decade, advancements in semiconductor technology as well as the construction of large data centers around the world have given rise to the possibility to connect anything to the internet. In today’s electronics industry, “Internet-of-things”-applications are in a huge demand where companies are being subject to massive competition. Given this reality, resources within a small development company need to be managed carefully and optimally. In this project, LabVIEW is used to develop a rig for automation of the previously time-consuming task of testing. The project has resulted in the benefits of faster test throughput and a more systematic testing procedure, enabling both development and sales staff to make faster and more confident decisions about if the product is ready to go when the customer needs it. The basis for a more comprehensive and statistical test is also laid due to the modular approach employed in the system design and software suite. (Less)
Please use this url to cite or link to this publication:
http://lup.lub.lu.se/student-papers/record/8913566
- author
- Ekelund, Per
- organization
- year
- 2017
- type
- M2 - Bachelor Degree
- subject
- keywords
- internet of things, functional testing, embedded electronics
- language
- English
- id
- 8913566
- date added to LUP
- 2017-06-10 04:10:01
- date last changed
- 2018-10-18 10:35:16
@misc{8913566,
abstract = {{The past decade, advancements in semiconductor technology as well as the construction of large data centers around the world have given rise to the possibility to connect anything to the internet. In today’s electronics industry, “Internet-of-things”-applications are in a huge demand where companies are being subject to massive competition. Given this reality, resources within a small development company need to be managed carefully and optimally. In this project, LabVIEW is used to develop a rig for automation of the previously time-consuming task of testing. The project has resulted in the benefits of faster test throughput and a more systematic testing procedure, enabling both development and sales staff to make faster and more confident decisions about if the product is ready to go when the customer needs it. The basis for a more comprehensive and statistical test is also laid due to the modular approach employed in the system design and software suite.}},
author = {{Ekelund, Per}},
language = {{eng}},
note = {{Student Paper}},
title = {{Embedded functional testing using LabVIEW}},
year = {{2017}},
}