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Embedded functional testing using LabVIEW

Ekelund, Per (2017)
Computer Science and Engineering (BSc)
Abstract
The past decade, advancements in semiconductor technology as well as the construction of large data centers around the world have given rise to the possibility to connect anything to the internet. In today’s electronics industry, “Internet-of-things”-applications are in a huge demand where companies are being subject to massive competition. Given this reality, resources within a small development company need to be managed carefully and optimally. In this project, LabVIEW is used to develop a rig for automation of the previously time-consuming task of testing. The project has resulted in the benefits of faster test throughput and a more systematic testing procedure, enabling both development and sales staff to make faster and more... (More)
The past decade, advancements in semiconductor technology as well as the construction of large data centers around the world have given rise to the possibility to connect anything to the internet. In today’s electronics industry, “Internet-of-things”-applications are in a huge demand where companies are being subject to massive competition. Given this reality, resources within a small development company need to be managed carefully and optimally. In this project, LabVIEW is used to develop a rig for automation of the previously time-consuming task of testing. The project has resulted in the benefits of faster test throughput and a more systematic testing procedure, enabling both development and sales staff to make faster and more confident decisions about if the product is ready to go when the customer needs it. The basis for a more comprehensive and statistical test is also laid due to the modular approach employed in the system design and software suite. (Less)
Please use this url to cite or link to this publication:
author
Ekelund, Per
organization
year
type
M2 - Bachelor Degree
subject
keywords
internet of things, functional testing, embedded electronics
language
English
id
8913566
date added to LUP
2017-06-10 04:10:01
date last changed
2018-10-18 10:35:16
@misc{8913566,
  abstract     = {The past decade, advancements in semiconductor technology as well as the construction of large data centers around the world have given rise to the possibility to connect anything to the internet. In today’s electronics industry, “Internet-of-things”-applications are in a huge demand where companies are being subject to massive competition. Given this reality, resources within a small development company need to be managed carefully and optimally. In this project, LabVIEW is used to develop a rig for automation of the previously time-consuming task of testing. The project has resulted in the benefits of faster test throughput and a more systematic testing procedure, enabling both development and sales staff to make faster and more confident decisions about if the product is ready to go when the customer needs it. The basis for a more comprehensive and statistical test is also laid due to the modular approach employed in the system design and software suite.},
  author       = {Ekelund, Per},
  keyword      = {internet of things,functional testing,embedded electronics},
  language     = {eng},
  note         = {Student Paper},
  title        = {Embedded functional testing using LabVIEW},
  year         = {2017},
}